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BS 6493-2.3-1987 半导体器件.集成电路.模拟集成电路推荐标准

作者:标准资料网 时间:2024-05-20 21:11:15  浏览:9791   来源:标准资料网
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【英文标准名称】:Semiconductordevices-Integratedcircuits-Recommendationsforanalogueintegratedcircuits
【原文标准名称】:半导体器件.集成电路.模拟集成电路推荐标准
【标准号】:BS6493-2.3-1987
【标准状态】:现行
【国别】:英国
【发布日期】:1987-01-30
【实施或试行日期】:1987-01-30
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:模拟电路;瞬时电压;视频放大器;射频放大器;中频放大器;电调节器;电流调节器;阻抗测量;放大器;差分放大器;频率响应;调压器;乱真信号;音频放大器;失效;短路电流试验;产品规范;放大;半导体器件;衰减;频率测量;电子设备及元件;电压测量;字母;集成电路;集成接点电路;耐久试验;电学测量;电流测量;布置;电性质和电现象;通信设备;电气试验;热稳定性;响应时间;运算放大器;额定值;性能;符号;电路;试验设备;定义;性能试验
【英文主题词】:Analogue;Analoguecircuits;Analogueintegratedcircuits;Definitions;Electricalengineering;Electricalmeasurement;Electricaltesting;Electronicengineering;Electronicequipmentandcomponents;Integratedcircuits;Life(durability);Limits(mathematics);Measuringtechniques;Microprocessors;Operatingconditions;Ratings;Read-onlystorage;Reliability;Semiconductordevices;Semiconductors;Specification(approval);Storagecircuits;Symbols;Technicaldatasheets;Testing
【摘要】:BritishStandardSemiconductordevicesNationalforewordCommitteesresponsibleCHAPTERⅠ:GENERALClause1.Introductorynote2.PurposeCHAPTERⅡ:TERMINOLOGYANDLETTERSYMBOLS1.Generalterms2.Termsrelatedtoratingsandcharacteristics2.1Linearamplifiers2.2Voltageandcurrentregulators2.3Analoguesignalswitchingcircuits(underconsideration)3.Lettersymbols3.1Amplifiers3.2Voltageandcurrentregulators3.3Analoguesignalswitchingcircuits(underconsideration)CHAPTERⅢ:ESSENTIALRATINGSANDCHARACTERISTICSSectionOne—Standardformatforthepresentationofpublisheddata1.Function2.Descriptionofcircuit3.Ratings(limitingvalues)4.Recommendedoperatingconditions5.Electricalcharacteristics6.Mechanicalcharacteristicsandotherdata7.ApplicationdataSectionTwo—Operationalamplifiers(havingtwoinputsandoneoutput)1.Function2.Descriptionofcircuit3.Ratings(limitingvalues)4.Recommendedoperatingconditions5.Electricalcharacteristics6.Mechanicalcharacteristicsandotherdata7.ApplicationdataSectionThree—Audioamplifiers,videoamplifiersandmultichannelamplifiersfortelecommunications1.Function2.Descriptionofcircuit3.Ratings(limitingvalues)4.Recommendedoperatingconditions5.Electricalcharacteristics6.Mechanicalcharacteristicsandotherdata7.ApplicationdataSectionFour—R.F.andI.F.amplifiers1.Function2.Descriptionofcircuit3.Ratings(limitingvalues)4.Recommendedoperatingconditions5.Electricalcharacteristics6.Mechanicalcharacteristicsandotherdata7.ApplicationdataSectionFive—Voltageandcurrentregulators1.Function2.Descriptionofcircuit3.Ratings(limitingvalues)4.Recommendedoperatingconditions5.Electricalcharacteristics6.Mechanicalcharacteristicsandotherdata7.Applicationdata(underconsideration)SectionSix—AnaloguesignalswitchingcircuitsGeneral1.Functionalspecifications2.Descriptionofcircuit3.Ratings(limitingvalues)4.Recommendedoperatingconditions5.Electricalcharacteristics6.Mechanicalcharacteristicsandotherdata7.ApplicationdataCHAPTERⅣ:MEASURINGMETHODSSectionOne—General1.Basicrequirements2.Specificrequirements3.ApplicationmatrixSectionTwo—Linearamplifiers(includingoperationalamplifiers)1.Specificrequirements2.Powersupplycurrents3.Small-signalinputimpedance4.Outputimpedance5.Inputoffsetvoltageofadifferential-inputlinearamplifierandbiasvoltageofasingle-ended-inputlinearamplifier6.Inputoffsetcurrent7.Inputbiascurrent8.Inputoffsetvoltagetemperaturecoefficient9.Inputoffsetcurrenttemperaturecoefficient10.Open-loopvoltageamplification11.Cut-offfrequency(frequencies)12.Common-moderejectionratio13.Supplyvoltagerejectionratio14.Outputvoltagerange(d.c.measurementonly)fordifferentialamplifiers15.Responsetimes16.Common-modeinputvoltagerange17.Short-circuitoutputcurrent(ofanoperationalamplifier)18.Cross-talkattenuation(formultipleamplifiers)19.Upperlimitingfrequencyforfulloutputvoltageswing20.Maximumrateofchangeoftheoutputvoltage(slewrate)21.Inputbiascurrenttemperaturecoefficient22.Cut-offfrequency,unity-gainfrequencySectionThree—Voltageregulators,excludingtwo-terminal(single-port)devices1.Specificrequirements2.Inputregulationcoefficientandinputstabilizationcoefficient3.Ripplerejectionratio4.Loadregulationcoefficientandloadstabilizationcoefficient5.Outputnoisevoltage6.Temperaturecoefficientofregulatedoutputvoltage7.Stand-bycurrent(quiescentcurrent)8.Short-circuitcurrent9.Referencevoltage10.Transientresponsetochangesofinputvoltage11.Tran
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:176P.;A4
【正文语种】:英语


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【英文标准名称】:Electricalsupplytracksystemsforluminaires;AmendmentA12;GermanversionEN60570:1996/A12:2000
【原文标准名称】:照明用供电线路系统.修改件A12
【标准号】:DINEN60570/A12-2000
【标准状态】:作废
【国别】:德国
【发布日期】:2000-08
【实施或试行日期】:2000-08-01
【发布单位】:德国标准化学会(DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:
【摘要】:
【中国标准分类号】:F21;K74
【国际标准分类号】:29_140_50
【页数】:4P;A4
【正文语种】:德语


【英文标准名称】:StandardTestMethodforDeterminationofEffectofDryHeatonPropertiesofPaperandBoard
【原文标准名称】:干热对纸和纸板特性的影响的试验方法
【标准号】:ASTMD776-1992(2001)
【标准状态】:作废
【国别】:
【发布日期】:1992
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:D06.92
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:特性;包装;干热试验;热学;纸板;包装件;纸;试验
【英文主题词】:acceleratedaging;agingqualitied;dryheat;paperboard;NumberCode85.060(Paperandboard)
【摘要】:Exposureofpaperorboardtoahostileenvironment,suchassometypesofradiation,elevatedtemperature,orchemicalattackoveraperiodofhours,mayprovideinformationconcerningthenaturalchangesthatmayoccurinthematerialove
【中国标准分类号】:Y30
【国际标准分类号】:85_060
【页数】:3P.;A4
【正文语种】:



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